TE Taylor Enterprises, Inc.
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Sampling Plan Analyzer Help System 

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Characteristic

The property inspected for. Sampling Plan Analyzer provides sampling plans for inspecting for the following characteristics:

Number of
Defective Units
Number of Defects Per Unit of Product
Number of
Defects Per Quantity of Product

Other characteristics not currently handled by Sampling Plan Analyzer include Average, Standard Deviation, Cp, Cpk, Cc, Mean Time Between Failures (MTBF), and Coefficient of Variation (CV). Look for these in future versions.